The elemental composition of the investigated particles, including multivariate statistical methods or enrichment factors, allows source identification. The calculation of the contribution of the particulate load in material flow calculations is also based on a precise knowledge of the chemical composition of the transported particles. Especially for atmospheric particles, the content of toxic elements must be known for a hazard assessment.

We enable the determination of their element contents in various particles either directly on the solid or after acid digestion by means of ICP-MS or ICP-OES. The elements that can be determined depend on the sample matrix, the element concentration and the method used. Specific individual particles can be examined by scanning electron microscopy (*REM; Department of Petrology and Mineralogy) after embedding and vapor deposition with regard to their elemental composition.

We will be pleased to advise you on your questions.


Element spectrum


X-ray fluorescence (XRF), angle dispersive,

Melting tablet

main elements (Na, K, Ca, Mg, Al, Si, Fe, Mn, Ti, P), loss on ignition

S4 Explorer, Bruker AXS

X-ray fluorescence (XRF), energy dispersive

Melt tablet/
powder bulk sample; filter samples

major elements (K, Ca, Fe, Mn, Ti)

div. trace elements

Epsilon 5, PANanlytical;

Epsilon 4, PANanlytical;

EDX 8000; Shimadzu

Carbon-sulfur analyzer (CSA)


CS-2000, ELTRA

Scanning electron microscope (SEM) coupled with X-ray fluorescence*.

High-resolution information (nm to µm) on mineral composition, grain shape, surface texture, etc.

Tescan Vega

Laser Ablation (LA)-ICP-MSHigh resolution geochemistry (µm range)Excimer+ Laser 193 nm (Teledyne Cetac)
ICP-MS (Element XR, Thermo Fisher)

div. digestions

Major and trace elements

ICP-MS (iCAP RQ, Thermo Fisher);
ICP-OES (Varian 715ES, iCAP 7000, Thermo Fisher)